The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2005
Filed:
Nov. 21, 2002
Peng Zheng, Alameda, CA (US);
Jennifer H. Gable, Walnut Creek, CA (US);
W. Dale Hall, Oakland, CA (US);
Kenneth G. Witte, San Jose, CA (US);
James R. Braig, Piedmont, CA (US);
Peng Zheng, Alameda, CA (US);
Jennifer H. Gable, Walnut Creek, CA (US);
W. Dale Hall, Oakland, CA (US);
Kenneth G. Witte, San Jose, CA (US);
James R. Braig, Piedmont, CA (US);
Optiscan Biomedical Corporation, Alameda, CA (US);
Abstract
An analyte detection system non-invasively determines the concentration of an analyte in a sample generating a sample infrared signal indicative of the concentration of the analyte in the sample. The detection system includes a window assembly for receiving the sample infrared signal. The window assembly is adapted to allow the sample infrared signal to transmit therethrough, and generates a window infrared signal. The detection system further includes at least one detector configured to receive both the window infrared signal and the sample infrared signal transmitted through the window assembly. The detector is further adapted to generate a detector signal in response thereto. The detection system further includes a correction module configured to generate a corrected detector signal indicative of the concentration of the analyte in the sample.