The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2005
Filed:
Feb. 26, 2002
Jeffrey George Jones, Wilbraham, MA (US);
Aidan Noel Hennigan, Millbury, MA (US);
John A. Curran, Worcester, MA (US);
Susan Kimberly Allen, Worcester, MA (US);
Normand J. Robichaud, Leominster, MA (US);
Jing Wang, Worcester, MA (US);
Kerry Ellen Flynn, Grafton, MA (US);
Jorge A. Garcés, Dudley, MA (US);
Christopher M. Palatucci, Shrewsbury, MA (US);
Jeffrey George Jones, Wilbraham, MA (US);
Aidan Noel Hennigan, Millbury, MA (US);
John A. Curran, Worcester, MA (US);
Susan Kimberly Allen, Worcester, MA (US);
Normand J. Robichaud, Leominster, MA (US);
Jing Wang, Worcester, MA (US);
Kerry Ellen Flynn, Grafton, MA (US);
Jorge A. Garcés, Dudley, MA (US);
Christopher M. Palatucci, Shrewsbury, MA (US);
Athena Diagnostics, Inc., Worcester, MA (US);
Abstract
The subject invention relates to methods for detection of mutations in a PKD gene using DHPLC. The invention includes the following aspects: identification of PKD unique sites; design of PKD-specific primers; amplification of PKD-specific products; and analysis of PCR amplified products by DHPLC. The invention further relates to compositions such as identified unique sites and PKD-specific primers, and kits for performing the methods of the invention.