The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2005
Filed:
Nov. 06, 2003
Kazuo Usui, Nagano, JP;
Yoshitomi Uchikawa, Nagano, JP;
Kazuo Usui, Nagano, JP;
Yoshitomi Uchikawa, Nagano, JP;
Nissei Plastic Industrial Co., Ltd., Nagano-ken, JP;
Abstract
When a determination condition is set for determining whether a molded product is non-defective or defective, a molding operation is performed a predetermined number of times. In each molding operation, an actual value of at least one monitor item which can serve as the basis for determining whether a molded product is non-defective or defective is detected. The detected actual values are displayed on a screen of a display in such a manner that a distribution of the actual values can be visually grasped. A sampling zone for the displayed actual values is designated in such a manner that a portion of the displayed actual values are contained in the sampling zone. The determination condition is automatically set on the basis of actual values contained in the sampling zone.