The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2005
Filed:
Jan. 20, 2004
Takashi Sasaki, Musashino, JP;
Takashi Sasaki, Musashino, JP;
Yokogawa Electronic Corporation, Tokyo, JP;
Abstract
The present invention solves the quality control problems that exist in manufacturing equipment for sheet form products, that is, although the position correspondence between actuators and measuring points has been measured and switched for every raw material recipe, it takes a lot of time and effort and if the position correspondence shifts during machine operation, the position correspondence must be measured again by measuring step responses. According to the present invention, the position correspondence, interference width, and process gain of a process model are modified so that the deviation between the process model and the measured profile is minimized by inputting the manipulated variable of the actuators to the process model. This position correspondence is also set to a cross direction controller that outputs the manipulated variable. Since this enables the position correspondence to be modified in succession to the optimum value during machine operation, it prevents controllability from deteriorating even if the position correspondence shifts, thereby eliminating time and effort for measuring and switching position correspondences for each raw material recipe.