The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2005
Filed:
Aug. 21, 2003
Applicants:
Wai T. Chan, Newburyport, MA (US);
Edward A. Reitman, Nashua, NH (US);
Jill P. Card, West Newbury, MA (US);
Inventors:
Wai T. Chan, Newburyport, MA (US);
Edward A. Reitman, Nashua, NH (US);
Jill P. Card, West Newbury, MA (US);
Assignee:
Ibex Process Technology, Inc., Lowell, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B013/02 ;
U.S. Cl.
CPC ...
Abstract
Failure prediction for complex processes is performed utilizing one or more nonlinear regression models to relate operational variable values measured at two or more times to predicted process metric values and maintenance variable values.
Chan, Wai. (2005). Advance failure prediction (U.S. Patent No. 6915173). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6915173
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile