The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2005
Filed:
Jun. 27, 2002
Hiroki Yoshida, Tochigi, JP;
Yoshihiro Ishibe, Tochigi, JP;
Keiichiro Ishihara, Tochigi, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
It is an object of the present invention to provide a multi-beam scanning optical system, which can reduce relative deviation of a writing position of each light-emitting portion due to focus deviation of a synchronization detection optical device, and an image forming apparatus using the same. In the multi-beam scanning optical system having the synchronization detection optical device including a light source device, an incident optical device, a deflection device, a scanning optical device and a slit, each element is set such that relative deviation of a writing position of each light beam due to deviation of a focus position within a main scanning cross section is reduced by a first light beam limiting element provided between the deflection device and the slit and a conditional expression is satisfied.