The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2005
Filed:
May. 21, 2002
Akira Yoshinaga, Numazu, JP;
Makoto Nishizawa, Numazu, JP;
Fumiyuki Kato, Shizuoka-ken, JP;
Jun Koike, Shizuoka-ken, JP;
Hiroshi Katsuta, Gotemba, JP;
Akira Yoshinaga, Numazu, JP;
Makoto Nishizawa, Numazu, JP;
Fumiyuki Kato, Shizuoka-ken, JP;
Jun Koike, Shizuoka-ken, JP;
Hiroshi Katsuta, Gotemba, JP;
Toshiba Machine Co., Ltd., Tokyo, JP;
Abstract
The present invention is directed to a method of monitoring operation data for quality control with a little possibility that a nondefective product is mistakenly determined as a defective product even if the operation data fluctuates in a large waviness curve. Every time an operation data piece for quality control is obtained, a moving average of the predetermined number of data pieces lately obtained is calculated. When the deviation of a data piece from the moving average exceeds the tolerance limit, an alarm is generated. By employing the method of the present invention for monitoring operation data such as charging time, injection time and the amount of cushion in an injection-molding machine, the accuracy of determination as to a defective or nondefective can be improved.