The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2005
Filed:
Aug. 15, 2002
William Dixon, Clifton Park, NY (US);
Daniel Blezek, Niskayuna, NY (US);
Paritosh Dhawale, Selkirk, NY (US);
William Dixon, Clifton Park, NY (US);
Daniel Blezek, Niskayuna, NY (US);
Paritosh Dhawale, Selkirk, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
Magnetic resonance imaging ('MRI') systems and methods for acquiring multi-slice gradient echo images having a substantially constant T-weighting including selecting a first scan having a desired contrast associated with T-weighting and, given a first repetition time, TR, and a first flip angle, flip, associated with the first scan, selecting an effective repetition time, TReff, that provides the desired contrast. The MRI systems and methods also including holding the effective repetition time, TReff, substantially constant in relation to a second scan. The MRI systems and methods further including, given a second repetition time, TR, determining a second flip angle, flip, and, given the second flip angle, flip, determining the second repetition time, TR. The MRI systems and methods still further including performing the second scan using the second repetition time, TR, and the second flip angle, flip, and maximizing a signal-to-noise ratio, S/N, of the second scan.