The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2005
Filed:
Dec. 17, 2001
Applicant:
Juergen Hoffmann, Wiesbaden, DE;
Inventor:
Juergen Hoffmann, Wiesbaden, DE;
Assignee:
Leica Microsystems Heidelberg GmbH, Mannheim, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B027/40 ; H01J003/14 ;
U.S. Cl.
CPC ...
Abstract
The scanning microscope comprises an illumination beam path (), microscope optics () and at least one light source (), which generates an excitation light beam () of a first wavelength and an emission light beam () of a second wavelength. The first focal region and the second focal region overlap partially. The optical properties of the components arranged in the illumination beam path () are matched to one another such that optical aberrations are corrected in such a way that the focal regions remain static relative to one another irrespective of the scanning movement.