The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2005

Filed:

Jul. 25, 2002
Applicants:

Michael Mcleod, Kemah, TX (US);

Gerhard Guenther, Seabrook, TX (US);

Nguong Van Nguyen, Pas, TX (US);

Inventors:

Michael McLeod, Kemah, TX (US);

Gerhard Guenther, Seabrook, TX (US);

Nguong van Nguyen, Pas, TX (US);

Assignee:

Fina Technology, Inc., Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08F110/02 ; C08F008/06 ;
U.S. Cl.
CPC ...
Abstract

A method of modifying a polyethylene material is accomplished by providing a polyethylene resin. The initial rheological breadth of the polyethylene resin is determined. The resin is then modified to adjust the rheological breadth of the polyethylene from the initial rheological breadth to a different rheological breadth that corresponds to a desired resin property, such as haze. A method for predicting clarity and rheological breadth properties is also provided, which utilizes a template of measured properties for polyethylene resins.


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