The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2005
Filed:
Jul. 31, 2001
Junya Kato, Chiba, JP;
Mikio Suzuki, Nakakoma, JP;
Junya Kato, Chiba, JP;
Mikio Suzuki, Nakakoma, JP;
Showa Denko K.K., Tokyo, JP;
Abstract
The present invention provides a method for inspecting deposition characteristics of a deposit on the surface of a protective film predominantly containing carbon of a magnetic recording medium, which medium includes a disk and the protective film formed on the disk, the disk including a non-magnetic substrate, a non-magnetic undercoat layer, and a magnetic layer, the layers being formed on the substrate, wherein the method includes comparing a predetermined threshold with the extraction amount of an inspection gas component and/or a compound component formed so as to contain the inspection gas component, the gas component and/or the compound component being extracted with an inspection solvent after the magnetic recording medium is allowed to stand in an atmosphere of the inspection gas component; a process for producing a magnetic recording medium in which the extraction amount is equal to or greater than the threshold, the extraction amount being obtained through the inspection method; and a magnetic recording medium produced through the production process.