The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2005
Filed:
Jul. 03, 2003
Mok-kun Jeong, Seoul, KR;
Sung-jae Kwon, Seoul, KR;
Mok-Kun Jeong, Seoul, KR;
Sung-Jae Kwon, Seoul, KR;
Madison Co., Ltd., Hongchun-gun, KR;
Abstract
A method and apparatus for measuring the elastic characteristics of a medium by estimating variations in the speckle patterns in ultrasound images. The method for measuring the elastic characteristics of a medium comprises the steps of applying vibrations to the medium; acquiring a plurality of ultrasound image frames of the medium; estimating a variation in brightness of the speckle pattern over the plurality of ultrasound image frames; and measuring the elastic characteristics of the medium based on the estimated brightness variation. The apparatus for measuring the elastic characteristics of a medium comprises a vibrator for applying vibrations to the medium; transducers for acquiring a plurality of ultrasound image frames of the medium; a device for estimating a variation in brightness of a speckle pattern over the plurality of ultrasound image frames; and a device for measuring the elastic characteristics of the medium based on the estimated brightness vibration.