The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2005
Filed:
Aug. 12, 2002
Jae Cheol Lim, Suwon-si, KR;
Hong JO Jeong, Pyungtak-si, KR;
Jae Cheol Lim, Suwon-si, KR;
Hong Jo Jeong, Pyungtak-si, KR;
Hitachi-LG Data Storage Korea, Inc., Seoul, KR;
Abstract
The present invention relates to method and apparatus of measuring axial vibration of a rotating disk. The present axial vibration measuring method selects a plurality of equally-spaced (45°˜120°-spaced) angular positions of a disk recording medium to conduct focusing operation at, conducts focusing operation at each selected position, measures focusing time from each start of the focusing operation to exactness in focus, and calculates axial vibration of the disk recording medium based on a deviation of the measured focusing times. The present method can measure exactly how much a rotating disk vibrates axially.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile