The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2005
Filed:
Sep. 08, 2003
Geng Wang, San Jose, CA (US);
Sang Y. Lee, Pleasanton, CA (US);
Geng Wang, San Jose, CA (US);
Sang Y. Lee, Pleasanton, CA (US);
Samsung Electronics. Co., Ltd., Suwon, KR;
Abstract
A method for dynamic in-situ characterization of in-plane and out-plane thermal drift of a hard disk drive head suspension is provided. A first data track is written. Amplitude and amplitude modulation of the write data signal are measured and track center is determined. Data tracks are then written for a selected time period. Amplitude and amplitude modulation of the write data signal is measured and a new track center of a last data track is determined. Any difference between the track center of the first data track and the track center of the last data track represents in-plane drift. The amplitude and amplitude modulation of the two write data signals is compared and any difference between the measured values is proportional to out-plane drift.