The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2005

Filed:

Oct. 28, 2003
Applicants:

Ana Martinez, Albuquerque, NM (US);

Armin W. Doerry, Albuquerque, NM (US);

Douglas L. Bickel, Albuquerque, NM (US);

Inventors:

Ana Martinez, Albuquerque, NM (US);

Armin W. Doerry, Albuquerque, NM (US);

Douglas L. Bickel, Albuquerque, NM (US);

Assignee:

Sandia Corporation, Albuquerque, NM (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S013/90 ;
U.S. Cl.
CPC ...
Abstract

A multi-antenna, multi-pass IFSAR mode utilizing data driven alignment of multiple independent passes can combine the scaling accuracy of a two-antenna, one-pass IFSAR mode with the height-noise performance of a one-antenna, two-pass IFSAR mode. A two-antenna, two-pass IFSAR mode can accurately estimate the larger antenna baseline from the data itself and reduce height-noise, allowing for more accurate information about target ground position locations and heights. The two-antenna, two-pass IFSAR mode can use coarser IFSAR data to estimate the larger antenna baseline. Multi-pass IFSAR can be extended to more than two (2) passes, thereby allowing true three-dimensional radar imaging from stand-off aircraft and satellite platforms.


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