The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2005
Filed:
Aug. 21, 2003
Taek-joon Jeon, Cheonan, KR;
Jae-hong Yun, Yongin, KR;
In-cheol Kim, Cheonan, KR;
Duk-soon Choi, Asan, KR;
Taek-Joon Jeon, Cheonan, KR;
Jae-Hong Yun, Yongin, KR;
In-Cheol Kim, Cheonan, KR;
Duk-Soon Choi, Asan, KR;
Samsung Electronics Co. Ltd, Suwon, KR;
Abstract
A semiconductor test system and method for the same. A handler is capable of moving and classifying semiconductor packages, a logic tester is capable of receiving a semiconductor package from the handler, and for testing a logic component of the semiconductor package. An analog tester may be coupled to the logic tester, where the analog tester is capable of testing an analog component of the semiconductor package. An interface unit may be included for selectively outputting a logic signal to enable the analog tester.