The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2005
Filed:
Feb. 22, 2002
Tapio Mäenpää, Helsinki, FI;
Tapio Mäenpää, Helsinki, FI;
Metso Paper, Inc., Helsinki, FI;
Abstract
In a measurement method in the manufacture of paper or paperboard, different forces prevailing in a nip between a roll and a counter roll of an apparatus conveying a paper or paperboard web are measured. In the method there are several measurement points implemented with one or more film sensors () placed in the roll () in the transverse direction of the paper or paperboard web. The measurement information obtained from the measurement points by means of the sensor or sensors () is utilized to determine the pressure distribution of the nip. The film sensor () is a piezo- and pyroluminescent sensor from which the measurement information can be received optically at least in the initial stage, or a sensor comprising an electromechanical film (EMFi). The sensors () placed in the calender roll () can be utilized to measure the pressure distribution of the calender nip (N).