The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2005

Filed:

Dec. 31, 2001
Applicants:

Philip T. Dempster, Concord, CA (US);

Mark Lowe, Danville, CA (US);

Inventors:

Philip T. Dempster, Concord, CA (US);

Mark Lowe, Danville, CA (US);

Assignee:

Life Measurement, Inc., Concord, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F017/00 ; E05D003/06 ; E05D007/04 ; E05C017/56 ;
U.S. Cl.
CPC ...
Abstract

Apparatus and methods for generating repeatable closure of a volume measurement chamber are provided. More particularly, in one embodiment of the present invention, a dual articulating hinge is used to affix a chamber door to a volume measurement chamber, providing repeatable closure of a chamber door. In another embodiment of the invention, a laterally compliant magnetic latch is used to fasten a chamber door to a volume measurement chamber. In a third embodiment, a chamber door lid is mounted to a hinge bar via a ball joint, allowing the chamber door lid to self center about the chamber opening.


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Dempster, Philip. (2005). Apparatus and methods for repeatable door closure in a plethysmographic measurement chamber (U.S. Patent No. 6910373). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6910373

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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