The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2005

Filed:

May. 12, 2003
Applicants:

Ramon S. CO, Trabuco Canyon, CA (US);

Tat Leung Lai, Torrance, CA (US);

David Da-wei Sun, Irvine, CA (US);

Inventors:

Ramon S. Co, Trabuco Canyon, CA (US);

Tat Leung Lai, Torrance, CA (US);

David Da-Wei Sun, Irvine, CA (US);

Assignee:

Kingston Technology Corp., Fountain Valley, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C029/00 ; G11C007/00 ; G01R031/02 ; G01R031/26 ;
U.S. Cl.
CPC ...
Abstract

An environmental tester for memory modules has an environmental chamber for heating the memory modules being tested. One side of the chamber is a backplane. The memory modules are inserted into sockets on module motherboards, which are inserted into motherboard sockets on the backplane. On the other side of the backplane, card sockets receive pattern-generator cards that are outside the environmental chamber but electrically connected to the module motherboards through the backplane. The pattern-generator cards contain pattern-generators that generate address, data, and control signals that exercise the memory modules. The pattern-generator cards can be cooled while the memory modules in the environmental chamber are heated. Pattern-generator cards can be removed for repair and module motherboards can be removed for inserting new memory modules for testing.


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