The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2005
Filed:
Feb. 15, 2001
Yang-lim Choi, Suwon, KR;
Youngsik Huh, Suwon, KR;
B. S. Manjunath, Santa Barbara, CA (US);
Peng Wu, Santa Barbara, CA (US);
Yang-lim Choi, Suwon, KR;
Youngsik Huh, Suwon, KR;
B. S. Manjunath, Santa Barbara, CA (US);
Peng Wu, Santa Barbara, CA (US);
Samsung Electronics Co., Ltd., Tokyo, JP;
The Regents of the University of California, Oakland, CA (US);
Abstract
An adaptive search method in feature vector space which can quickly search the feature vector space indexed based on approximation for a feature vector having features similar to a query vector according to a varying distance measurement is provided. The adaptive search method includes the steps of (a) performing a similarity measurement on a given query vector within the feature vector space, and (b) applying search conditions limited by the result of the similar measurement obtained in the step (a) and performing a changed similarity measurement on the given query vector. According to the adaptive search method, the number of candidate approximation regions is reduced during a varying distance measurement such as an on-line retrieval, which improves the search speed.