The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2005
Filed:
Oct. 18, 2002
Applicant:
Takashi Yamasaki, Hyogo, JP;
Inventor:
Takashi Yamasaki, Hyogo, JP;
Assignee:
Agilent Technologies, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R035/00 ; G01R027/04 ;
U.S. Cl.
CPC ...
Abstract
To enable the measurer to easily verify the parameter correction conditions, the correction conditions for the parameters measurable by the measurement device are concurrently displayed on the screen of the measurement device related to the ports used in the parameter measurement. The rows and columns are the receive ports and send ports. The symbol F and the symbol R indicate the type of calibration method applied to the parameters measured by the ports specified in the matrix.