The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2005

Filed:

Jun. 08, 2001
Applicants:

Hannu T. T. Toivonen, Helsinki, FI;

Päivi Onkamo, Helsinki, FI;

Kari Vasko, Helsinki, FI;

Vesa Ollikainen, Helsinki, FI;

Petteri Sevon, Helsinki, FI;

Heikki Mannila, Espoo, FI;

Juha Kere, Espoo, FI;

Inventors:

Hannu T. T. Toivonen, Helsinki, FI;

Päivi Onkamo, Helsinki, FI;

Kari Vasko, Helsinki, FI;

Vesa Ollikainen, Helsinki, FI;

Petteri Sevon, Helsinki, FI;

Heikki Mannila, Espoo, FI;

Juha Kere, Espoo, FI;

Assignee:

Licentia Oy, Helsinki, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N033/48 ; G01N033/50 ; G06F007/00 ;
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method for gene mapping from chromosome and phenotype data, which utilizes linkage disequilibrium between genetic markers m, which are polymorphic nucleic acid or protein sequences or strings of single-nucleotide polymorphisms deriving from a chromosomal region. All marker patterns P that satisfy a certain pattern evaluation function e(P) are searched from the data, each marker mof the data is scored by a marker score and the location of the gene is predicted as a function of the scores s(m) of all the markers min the data.


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