The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2005
Filed:
Nov. 15, 2002
Kevin Kidoo Lee, Malden, MA (US);
Christian Hoepfner, North Andover, MA (US);
Desmond Rodney Lim, Singapore, SG;
Wang-yuhl OH, Cambridge, MA (US);
Kevin Kidoo Lee, Malden, MA (US);
Christian Hoepfner, North Andover, MA (US);
Desmond Rodney Lim, Singapore, SG;
Wang-Yuhl Oh, Cambridge, MA (US);
Enablence Holdings LLC, Greenville, SC (US);
Abstract
A method for testing an optical chip, while the optical chip is still on a wafer, utilizing an optical probe, includes the steps of creating an access point on the wafer adjacent the optical chip. Inserting a probe at the access point to optically couple the optical probe and optical chip. The optical probe includes at least a first optical waveguide for changing the direction of input light at the probe to optically couple with the optical chip at the access point.