The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2005
Filed:
Nov. 23, 2001
Harlan M. Romsdahl, Half Moon Bay, CA (US);
Wei Zhang, Union City, CA (US);
Alexander C. Schneider, Sunnyvale, CA (US);
Harlan M. Romsdahl, Half Moon Bay, CA (US);
Wei Zhang, Union City, CA (US);
Alexander C. Schneider, Sunnyvale, CA (US);
R2 Technology, Inc., Los Altos, CA (US);
Abstract
An algorithm is quickly scans a digital image volume to detect density nodules. A first stage is based on a transform to quickly highlight regions requiring further processing. The first stage operates with somewhat lower sensitivity than is possible with more detailed analyses, but operates to highlight regions for further analysis and processing. The transform dynamically adapts to various nodule sizes through the use of radial zones. A second stage uses a detailed gradient distribution analysis that only operates on voxels that pass a threshold of the first stage.