The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2005

Filed:

Feb. 26, 2002
Applicants:

Nigel Copner, Fremont, CA (US);

Adam D. Cohen, Milford, MA (US);

Kim L. Tan, San Jose, CA (US);

Christopher John Abraham, Mountain View, CA (US);

Feliks Lapinski, Fremont, CA (US);

Inventors:

Nigel Copner, Fremont, CA (US);

Adam D. Cohen, Milford, MA (US);

Kim L. Tan, San Jose, CA (US);

Christopher John Abraham, Mountain View, CA (US);

Feliks Lapinski, Fremont, CA (US);

Assignee:

JDS Uniphase Corporation, San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B027/00 ; G02B027/14 ; G01B009/02 ;
U.S. Cl.
CPC ...
Abstract

An apparatus is described for controlling the optical path length in an optical device, e.g. an interferometer, and more importantly to maintaining the optical path length difference in an interferometer. The apparatus may include an adjustable plate optically coupled with a beamsplitter. The plate may be rotated such that its surface receives light propagated from the beamsplitter at a non-zero incident angle. In one embodiment, temperature sensitivity is addressed by ensuring that the refractive index of the plate is greater than the refractive index of the beamsplitter. In another embodiment, the apparatus includes combination spacers having a component selected in dependence upon a composition, thickness, and orientation of the adjustable plate.


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