The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2005
Filed:
Mar. 21, 2003
Norihide Yamada, Kokubunji, JP;
Norihide Yamada, Kokubunji, JP;
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
Apparatus and methods of measuring optical waveforms are described. In one aspect, an optical waveform measurement apparatus includes a light wave source, a mixer, a down converter, and a controller. The light wave source is operable to provide an adjustable frequency light wave with a frequency that is adjustable over a target frequency range. The mixer is operable to mix a target modulated optical signal with the adjustable frequency light wave to obtain a mixed signal. The frequency down converter is operable to down convert the mixed signal to obtain a down-converted signal. The controller is operable to extract from the down-converted signal amplitude and phase information relating to the target modulated optical signal and to cause the light wave source to incrementally adjust the frequency of the adjustable frequency light wave over the target frequency range.