The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2005
Filed:
Jan. 16, 2003
Takeshi Takagi, Tokyo, JP;
Kazuhiro Ikeda, Tokyo, JP;
Tatsuya Hatano, Tokyo, JP;
Hiroshi Matsuura, Tokyo, JP;
Takeshi Takagi, Tokyo, JP;
Kazuhiro Ikeda, Tokyo, JP;
Tatsuya Hatano, Tokyo, JP;
Hiroshi Matsuura, Tokyo, JP;
The Furukawa Electric Co., Ltd., Tokyo, JP;
Abstract
An object is to accurately measure the Stokes parameters, without the occurrence of polarization fluctuations or PDL during the splitting of the incident light. When the incident light is made incident on a first-stage prism, the light is split into two first splitting light rays. Next, the first split light rays are respectively incident on a pair of prisms of a second stage. Each of the pair of first split light rays is split into two rays by a second-stage prism, to obtain four second split light rays.