The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2005
Filed:
Aug. 17, 2001
Method and apparatus for measuring the geometrical structure of an optical component in transmission
Pierre Devie, Chevily Larue, FR;
Francis Bell, Rueil-Malmaison, FR;
Gilles Le Saux, Paris, FR;
Essilor International, , FR;
Abstract
A method for measuring the geometrical structure of an optical component () in transmission, comprises illuminating the optical component by means of a first incident beam (), the wavefront of which is known. After the first beam is transmitted by the optical component, its wavefront is measured by deflectometry (). The optical component is then illuminated by a second incident beam (), the wavefront of which is known. After the second beam is transmitted by the optical component, its wavefront is measured by deflectometry (). The geometrical structure of the optical component is then calculated from the measured wavefronts. Measuring light transmitted in two distinct optical configurations allows a calculation by optimizing the two surfaces of the component, without prior knowledge of one of the surfaces. The first and second beams may be different and may illuminate the same surface of the component; thus it is possible to use identical beams and to illuminate each surface of the component in succession.