The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2005

Filed:

Mar. 09, 2000
Applicant:

Sten Lindau, Täby, SE;

Inventor:

Sten Lindau, Täby, SE;

Assignee:

Saabtech Electronics AB, Järfälla, SE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J005/20 ;
U.S. Cl.
CPC ...
Abstract

A quantum well based two-dimensional detector () for detecting infrared radiation which receives infrared radiation falling upon its detector surface () at various angles of incidence. The detector comprises a grating arrangement for diffraction of the incident radiation. The arrangement is selected with a grating interval which varies or changes from the central part of the detector. out towards the outer parts of the detector. The variation or change in the grating interval is arranged to retain in the detection diffracted rays of the orders 1 and −1 as active components over the whole detector surface by changing the angle values of the diffracted rays depending upon the angles of incidence of the radiation falling on various parts of the detector surface.


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