The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2005
Filed:
Nov. 13, 2001
Thomas Basilio Genduso, Apex, NC (US);
Douglas Michael Pase, Raleigh, NC (US);
Thomas Basilio Genduso, Apex, NC (US);
Douglas Michael Pase, Raleigh, NC (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A connection assembly comprising a receptacle portion and a probe portion. The receptacle portion is suitable for attaching to an adapter card. The receptacle may include a cylindrical housing with a longitudinal axis oriented perpendicular to the plane of the card. The receptacle includes a set of contact structures that extend within the interior of the receptacle housing. The set of contact structures are embedded within an electrically insulating contact block and preferably define one or more lines of contact structures extending perpendicularly to the plane of the adapter card. Each contact structure is electrically connected to a corresponding cable or wire. The probe portion may include a probe cover and a probe body configured to be received within the probe cover. The probe cover preferably comprises first and second elements that are separated by a gap that extends parallel to the longitudinal axis of the receptacle. The probe body includes a row of contact elements where each contact element is connected to a corresponding wire or cable. The probe body is preferably rotatable 90° with respect to the probe cover when the probe assembly is inserted in the receptacle. The probe body may be rotatable from a first position, in which the contact elements are covered by the probe cover, to a second position, in which the contact elements are aligned with the probe cover gap(s) and further aligned with corresponding contact structures on the interior surface of the receptacle.