The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2005
Filed:
Feb. 22, 2001
Hjalmar Perez, Austin, TX (US);
Kurt Mandeville, Austin, TX (US);
Paul Packebush, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
A system and method for testing a group of related products or devices. According to one embodiment, the user may first manually create a base test sequence, and child test sequences may then be created based on the base test sequence. The user may include various steps in the base test sequence, such that the base test sequence includes steps that need to be common to most or all of the child test sequences. The user may also configure parameters or properties for each step in the base test sequence, such that the parameter configuration is what is required for most or all of the child test sequences. Initial child test sequences may then be automatically created as instances of the base test sequence. The user may then manually edit the instances of the base test sequence to produce the desired child test sequences, such that each child test sequence is configured to appropriately test a particular product to which the child test sequence corresponds. For example, the user may change a parameter configuration for one or more steps in the child test sequence, may add a step to or remove a step from the child test sequence, etc. In the preferred embodiment, the child test sequences may also be automatically changed or updated in various ways. For example, the user may manually add a new step to the base test sequence, and in response the new step may be automatically added to each child test sequence. As another example, the user may manually change the parameter configuration for a step in the base test sequence, and in response the parameter configuration change may be automatically propagated to each child test sequence.