The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2005
Filed:
Oct. 19, 2000
Yukihiro Nomura, Kawasaki, JP;
Hiroyuki Fujimoto, Kawasaki, JP;
Takahiro Suzuki, Kawasaki, JP;
Tatsuya Kanda, Kawasaki, JP;
Yasurou Matsuzaki, Kawasaki, JP;
Masahiko Saitou, Kawasaki, JP;
Hiroyoshi Tomita, Kawasaki, JP;
Yukihiro Nomura, Kawasaki, JP;
Hiroyuki Fujimoto, Kawasaki, JP;
Takahiro Suzuki, Kawasaki, JP;
Tatsuya Kanda, Kawasaki, JP;
Yasurou Matsuzaki, Kawasaki, JP;
Masahiko Saitou, Kawasaki, JP;
Hiroyoshi Tomita, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
The present invention is a self-test circuit (BIST) incorporated in the memory device, which is activated in response to a test activation signal from outside. When this self-test circuit is activated in response to a test activation signal (WBIZ) from outside, it generates a test operation command (WBI-CMD), generates a test address (WBI-ADD), and generates test data (WBI-DATA). Furthermore, after the self-test circuit writes the test data to a memory cell, it effects a comparison to establish whether or not the read data that is read from this memory cell is the same as the test data that was written thereto and stores information as to the result of this comparison. This comparison result information is then output to the outside.