The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2005
Filed:
Jun. 18, 2001
Andrew Popplewell, Manchester, GB;
Paul C. Gregory, Bolton, GB;
Andrew Popplewell, Manchester, GB;
Paul C. Gregory, Bolton, GB;
LSI Logic Corporation, Milpitas, CA (US);
Abstract
An on-chip data independent method and apparatus for channel error estimation in a data recovery scheme is based on measuring phase noise statistics. The apparatus () receives a data pulse and four quadrature clock signals and has a discriminating device () to provide a count signal for each data pulse received depending on which clock signal was the first to clock the particular data pulse. A pair of counters (and) counts the number of data pulses received at different phase offsets to provide a value representing a statistical ratio of the counts at different clock phase offsets from which an error rate for the received data pulses based on the counts at different clock phase offsets can be determined from a look-up table (). By re-configuring the circuitry, the system can be adapted to measure clock window asymmetry.