The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2005

Filed:

May. 15, 2001
Applicants:

Masao Okada, Tokyo, JP;

Yongmei Liu, Chiba-ken, JP;

Inventors:

Masao Okada, Tokyo, JP;

Yongmei Liu, Chiba-ken, JP;

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F017/00 ;
U.S. Cl.
CPC ...
Abstract

A method for finding rules and exceptions from a database uses four stages programmed into a computer, wherein the four stages include an adaptive stage for creating in accordance with a user's previously inputted specifications, a parameter file of rules and exceptions finding conditions in accordance with the user's specifications, with the file being displayed to the user; a data model stage for analyzing the parameters from the parameter file, and retrieving data from one or more databases in accordance with the parameters; a problem formulator stage for transforming the retrieved data into a formalized data structure compatible with the parameters, and creating a catalog of possible attributes; and a solving stage for generating rules and exceptions from the formalized data by using the parameters and the catalog, and sending the result to the adaptive stage.


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