The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2005
Filed:
Mar. 12, 2001
Method and apparatus for measuring and estimating optical signal to noise ratio in photonic networks
Richard W Heath, Harlow, GB;
Peter J Anslow, Herts, GB;
Richard W Heath, Harlow, GB;
Peter J Anslow, Herts, GB;
Nortel Networks Limited, St. Laurent, CA;
Abstract
A WDM optical network comprising a plurality of nodes has a first apparatus for optical analysis at the site of a first optical amplifier upstream of the first node, a second apparatus for optical analysis at the site of a second optical amplifier at the downstream output of the first node, and a third apparatus for optical analysis at the site of a third optical amplifier further downstream of the first node, where knowledge of the optical sin to noise ratio (OSNR) is desired. The first, second and third apparatus are for measuring the signal level at frequencies both at and in-between the channel frequencies. The signal levels at the channel frequencies and between the channel frequencies at the first, second and third apparatus are used to derive the OSNR at the third apparatus. This enables the OSNR to be measured accurately at any site in the network, using calculations in which noise shaping of the nodes can be factored in to the calculation of OSNR.