The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2005
Filed:
Sep. 13, 2001
Sang Hoon Chu, Santa Clara, CA (US);
Jun Seok Shim, Cupertino, CA (US);
Seong Hwon Yu, San Jose, CA (US);
Soo IL Choi, Santa Clara, CA (US);
Sang Hoon Chu, Santa Clara, CA (US);
Jun Seok Shim, Cupertino, CA (US);
Seong Hwon Yu, San Jose, CA (US);
Soo Il Choi, Santa Clara, CA (US);
Samsung Electronics Ltd., Co., Suwon, KR;
Abstract
The present disclosure relates to a system for detecting a plurality of defect types on the surface of a disk in a hard disk drive. In particular, the disclosure relates to utilizing information obtained from a plurality of servo bits to determine if a sector contains a physical defect. Where such a defect is found, the sector's write gate is disabled and its burst signal data is ignored for track following purposes. In addition, large changes in PES are used to identify closure spike defects. Such defects are managed by providing a compensation signal to the read value of the PES to improve track following. Finally, high PES values are used to signal a third defect type where no other signs of defect are present. In such case, the sector is mapped as defective, but the burst signals continue to be used for track following purposes.