The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2005
Filed:
Jun. 04, 2003
Toshiaki Nihoshi, Yokohama, JP;
Hisashi Okugawa, Kanagawa, JP;
Toshiaki Nihoshi, Yokohama, JP;
Hisashi Okugawa, Kanagawa, JP;
Nikon Corporation, Tokyo, JP;
Abstract
An epi-illumination apparatus for fluorescent observation, adjusting light intensities of a plurality of illuminations on a sample over a wide wavelength band continuously and being configured inexpensively, and a fluorescence microscope having the same are provided. A light source, extracting means, an aperture stop, and a filter are arranged on a predetermined optical axis. The aperture stop is arranged on a plane generally conjugated with a pupil plane of an objective. The filter is placed near the aperture stop. The extracting means extracts a plurality of narrow wavelength bands from the wavelength band of the illumination emitted from the light source. The filter has regions of different spectral transmission characteristics to the narrow wavelength bands. The adjusting means for adjusting light intensities of transmitted light from the filter in the narrow wavelength bands independently by moving the filter in a direction orthogonal to the optical axis is provided.