The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2005
Filed:
Dec. 04, 2001
Dirk Voelkel, Heidelberg, DE;
Dirk Voelkel, Heidelberg, DE;
Roche Diagnostic Operations, Inc., Indianapolis, IN (US);
Abstract
System for analyzing sample liquids by evaluating test elements with an analytical unit () in which a test element () to be analyzed is positioned by a holder () in an analytical position relative to the analytical unit and the system additionally comprises a position control unit to check whether an analytical area of the test element is correctly positioned relative to the analytical unit wherein the position control unit comprises a light source () to irradiate an area of the test element and preferably the analytical area (), a detector () to detect light reflected from the area and an evaluation unit, and the light source and detector are positioned relative to one another in such a manner that the light intensity of specularly reflected radiation at the detector when the test element is correctly positioned is different from a light intensity when it is incorrectly positioned and the evaluation unit recognizes any faulty positioning on the basis of the light intensity at the detector. In addition the invention concerns a method for sample analysis using a position control unit to check whether a test element is correctly positioned relative to an evaluation optics.