The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2005

Filed:

Mar. 16, 2000
Applicants:

Atsushi Tanaka, Yamato, JP;

Masahide Hasegawa, Yokohama, JP;

Kiwamu Kobayashi, Yokohama, JP;

Masaaki Kanashiki, Yokohama, JP;

Yuichiro Yoshimura, Kamakura, JP;

Katsuyuki Kobayashi, Yokohama, JP;

Inventors:

Atsushi Tanaka, Yamato, JP;

Masahide Hasegawa, Yokohama, JP;

Kiwamu Kobayashi, Yokohama, JP;

Masaaki Kanashiki, Yokohama, JP;

Yuichiro Yoshimura, Kamakura, JP;

Katsuyuki Kobayashi, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G005/00 ; G08C021/00 ;
U.S. Cl.
CPC ...
Abstract

A device has a plurality of linear sensors which are arranged for at least one coordinate axis and detect the beam spot. The levels of detected data are measured by a sensor controller, and the measured levels are compared. Based on the comparison result, the detection result of one of the plurality of linear sensors is selected. A coordinate computation unit outputs a coordinate value corresponding to the beam spot on the basis of the selected detection result. The light-receiving areas of the linear sensors have an overlapping portion.


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