The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2005
Filed:
Nov. 26, 2002
Paul H. Shelley, Lakewood, WA (US);
Diane R. Lariviere, Seattle, WA (US);
Paul H. Shelley, Lakewood, WA (US);
Diane R. LaRiviere, Seattle, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Amount of coating cure or contamination is determined. An infrared beam is transmitted into a crystal. The beam reflects off an internal face at an angle higher than critical reflection angle to generate total reflection at the crystal face. The beam exits the crystal, is filtered at two wavelengths, and is detected to give values Iand Iof infrared energy reflected without coating. A coated sample contacts an outside face of the crystal. An evanescent wave penetrates the sample where the beam reflects from internal crystal face. The beam is partially absorbed by sample, exits the crystal, is filtered at two wavelengths, and is detected to give values Iand Iof infrared energy reflected with coating. Absorbance values Aand Aat two wavelengths are A=−log(I/I) and A=−log(I/I). Amount of cure or contamination is proportional to ratio or difference between Aand A