The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2005
Filed:
Oct. 16, 2001
Toshifumi Mihashi, Tokyo, JP;
Yoko Hirohara, Tokyo, JP;
Naoyuki Maeda, Osaka, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
Measurement data (measured results) obtained under a plurality of conditions and image data and/or numerical data corresponding to the measured results are displayed collectively or selectively. An optical characteristics measuring device () measures/displays, for example, the optical characteristics of an eye to be measured () as an object. A first lighting optical system () includes a first light source () for applying an optical flux of a specified pattern to the eye to be measured (). A first light receiving optical system () includes a first light receiving unit () for receiving light reflected from the eye (). A light transmitting/receiving optical system () mainly conducts an alignment adjustment, and includes a second light receiving unit () for receiving light reflected from the eye (). A common optical system () is disposed on the optical axis of a light flux emitted from the first lighting optical system (), and is commonly included in the first lighting.