The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6904695 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 14, 2005

Filed:

Nov. 09, 2001
Applicants:

Hans-joachim Freitag, Jena, DE;

Heinz-guenther Franz, Hamburg, DE;

Andreas Schmidt, Erfurt, DE;

Inventors:

Hans-Joachim Freitag, Jena, DE;

Heinz-Guenther Franz, Hamburg, DE;

Andreas Schmidt, Erfurt, DE;

Assignee:

Optolab Licensing GmbH, Hamburg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D011/16 ; G01D018/00 ;
U.S. Cl.
CPC ...
Abstract

The invention relates to a position measuring system for scanning a movement between a first element and a second element which is arranged in a moveable manner in relation to the first element. Said system comprises a material measure which can be fixed to the first element and has a scale carrier, and a scanning head which can be fixed to the second element and which scans a movement of the material measure in relation to the scanning head. The inventive system comprises a mount by which means the material measure and the scanning head can be fixed to each other in a pre-determined position, the scanning head being detachably fixed to the scale carrier. In order to assembly one such position measuring system on a first element and a second element moving in relation thereto, the scanning head is fixed to the material measure in such a way that the scanning head and the material measure are mutually fixed in position. The material measure is then applied to the first element and the scanning head to the second element, the scanning head or the material measure being fixed to the respective element, filling the gap, in the position which is pre-determined by the positioned mount. The mount between the scanning head and the material measure is then detached.


Find Patent Forward Citations

Freitag, Hans-Joachim. (2005). Position measuring system and method for the assembly thereof (U.S. Patent No. 6904695). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6904695

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