The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2005
Filed:
Mar. 17, 2003
G. Kevin Liu, Simi Valley, CA (US);
John Mark, Pasadena, CA (US);
Daniel A. Tazartes, West Hills, CA (US);
G. Kevin Liu, Simi Valley, CA (US);
John Mark, Pasadena, CA (US);
Daniel A. Tazartes, West Hills, CA (US);
Northrop Grumman Corporation, Woodland Hills, CA (US);
Abstract
System and method for measuring force-dependent gyroscopic sensitivity. A force-effect model of the effects of acceleration on the output of a gyro triad is determined. Rotation sequences are then devised to permit excitation and observation of force-effect model parameters in order to provide calibration information for these parameters. A state diagram containing the gyro triad force-effect model parameters is derived from the force-effect model, where moving from one position in the state diagram to another position indicates the gyro triad error which would occur in rotating the gyro triad according to a corresponding motion. Searching for all possible closed loop paths achievable through the state diagram, by a multiple-axes rate table with a specified number of rotations, to separate gyro triad error calibration from the accelerometer calibration. Closed loop paths having minimal lengths and exhibiting larger error sensitivity are chosen to perform error parameter calibration and reduce force-dependent gyroscopic sensitivity.