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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6904375 B1

PDFFull Text
Date of Patent:
Jun. 07, 2005

Filed:

Jan. 22, 2003

Method and circuits for testing high speed devices using low speed ate testers

Applicants:

Sabih Sabih, Austin, TX (US);

Jari Vahe, Austin, TX (US);

Inventors:

Sabih Sabih, Austin, TX (US);

Jari Vahe, Austin, TX (US);

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorneys:

Arthur J. Behiel

LeRoy D. Maunu

Justin Liu

Primary Examiner:

Marc S Hoff

Assistant Examiner:

Mary Catherine Baran

Int. Cl.
CPC ...
G01R022/00 ;
U.S. Cl.
CPC ...
Abstract

A bridge circuit disposed between a device under test (DUT) and conventional automatic test equipment (ATE) extends the performance of the ATE. The bridge circuit allows the ATE to test ICs capable of operating at frequencies above the ATE's normal performance limits. In some embodiments, the bridge circuit also extends ATE functionality, providing frame alignment and automatic test-vector generation, for example, and can increase the number of available test channels.

Find Patent Forward Citations

Sabih, Sabih. (2005). Method and circuits for testing high speed devices using low speed ate testers (U.S. Patent No. 6904375). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6904375

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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