The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2005

Filed:

Nov. 18, 2002
Applicants:

Robert L. Popp, Hortonville, WI (US);

Kyle S. Allen, Neenah, WI (US);

Jamie L. Bell, Brillion, WI (US);

Henry L. Carbone, Ii, St. Paul, MN (US);

Scott G. Chapple, Neenah, WI (US);

Clinton David Clark, Reno, TX (US);

Tim G. Dollevoet, Kimberly, WI (US);

John G. Hein, Appleton, WI (US);

Archie Dodds Morgan, Neenah, WI (US);

Nicholas A. Popp, Appleton, WI (US);

Shawn A. Quereshi, Neenah, WI (US);

Erica C. Tremble, Appleton, WI (US);

Inventors:

Robert L. Popp, Hortonville, WI (US);

Kyle S. Allen, Neenah, WI (US);

Jamie L. Bell, Brillion, WI (US);

Henry L. Carbone, II, St. Paul, MN (US);

Scott G. Chapple, Neenah, WI (US);

Clinton David Clark, Reno, TX (US);

Tim G. Dollevoet, Kimberly, WI (US);

John G. Hein, Appleton, WI (US);

Archie Dodds Morgan, Neenah, WI (US);

Nicholas A. Popp, Appleton, WI (US);

Shawn A. Quereshi, Neenah, WI (US);

Erica C. Tremble, Appleton, WI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F019/00 ; B32B031/00 ;
U.S. Cl.
CPC ...
Abstract

Systems and methods for automatically troubleshooting a machine, suitable for use in connection with a high speed web converting manufacturing process having at least one machine operating at a set point and producing a composite article from a sequential addition of component parts during a production run of composite articles. A first inspection system is adapted to automatically inspect a first aspect of a composite article being produced during the production run. A second inspection system is adapted to automatically inspect a second aspect of the composite article. A logic system is adapted to obtain via the communication network a plurality of the first inspection parameters, each corresponding to one of a plurality of composite articles produced during the production run and is further adapted to determine a corrective action.


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