The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2005

Filed:

Mar. 17, 2000
Applicants:

Kaori Fujimura, Yokosuka, JP;

Kiyotaka Otsuji, Kamakura, JP;

Yuichi Fujino, Kiyose, JP;

Sakuichi Ohtsuka, Yokohama, JP;

Koji Ogawa, Yokohama, JP;

Hitomi Sato, Yokosuka, JP;

Harumi Kawashima, Yokosuka, JP;

Inventors:

Kaori Fujimura, Yokosuka, JP;

Kiyotaka Otsuji, Kamakura, JP;

Yuichi Fujino, Kiyose, JP;

Sakuichi Ohtsuka, Yokohama, JP;

Koji Ogawa, Yokohama, JP;

Hitomi Sato, Yokosuka, JP;

Harumi Kawashima, Yokosuka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K009/00 ; G06K009/32 ; H05G001/28 ;
U.S. Cl.
CPC ...
Abstract

A tomographic image reading method for extracting a comparison image corresponding to a diagnostic image, the diagnostic image being one of first tomographic images, the comparison image being one of second tomographic images, the method including the steps of: inputting the first images and the second images; generating a first projection image from the first images and a second projection image from the second images; measuring shift amount between the first projection image and the second projection image by using a template; correcting the slice position according to the shift amount; and displaying the diagnostic image and the comparison image to a monitor.


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