The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2005

Filed:

Jul. 22, 2003
Applicants:

Xiaoye Wu, Rexford, NY (US);

James Leblanc, Niskayuna, NY (US);

Armin Pfoh, Starnberg, DE;

Inventors:

Xiaoye Wu, Rexford, NY (US);

James LeBlanc, Niskayuna, NY (US);

Armin Pfoh, Starnberg, DE;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N023/00 ;
U.S. Cl.
CPC ...
Abstract

The present technique provides for the generation of density maps using one or more basis material decomposition tables or functions. The basis material decomposition tables or functions are generated by simulating the system response to various lengths of basis materials using component characteristics of the CT system as well as the attenuation coefficient for the desired basis material. Measured projection data may be processed using the basis material decomposition tables or functions to provide a set of density line-integral projections that may be reconstructed to form a density map or image.


Find Patent Forward Citations

Quick Actions:

Wu, Xiaoye. (2005). Method and apparatus for generating a density map using dual-energy ct (U.S. Patent No. 6904118). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6904118

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