The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2005
Filed:
Nov. 22, 2002
Takashi Fukano, Wako, JP;
Atsushi Miyawaki, Wako, JP;
Keiji Shimizu, Fussa, JP;
Yoshihiro Kawano, Hicksville, NY (US);
Takashi Fukano, Wako, JP;
Atsushi Miyawaki, Wako, JP;
Keiji Shimizu, Fussa, JP;
Yoshihiro Kawano, Hicksville, NY (US);
Olympus Corporation, Tokyo, JP;
Abstract
An illumination system for microscopy includes a light source, a first spectral element dispersing light from the light source, a reflecting member selectively reflecting light dispersed by the first spectral element, a second spectral element combining light reflected by the reflecting member, a dichroic mirror, an objective lens, and an image sensor. The first spectral element is placed at the front focal point of a first lens, the reflecting member is placed at a position where the back focal point of the first lens coincides with the front focal point of a second lens, and the second spectral element is placed at the back focal point of the second lens.