The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2005
Filed:
Dec. 01, 2003
Laurent Sarger, Talence, FR;
Philippe Fichot, Begles, FR;
Edouard Nau, Bordeaux, FR;
Abstract
A method for detecting chemical species present in a condensed medium including determining characteristic wavelengths and intensity values of back-scattered electromagnetic emission signals due to fluorescence of chemical species excited in response to a multiplicity of electromagnetic excitations of distinct wavelengths of at least one chemical species that could be contained in the condensed medium; successively exciting a multiplicity of surface elements of a surface portion of the condensed medium with a laser beam having tunable wavelength capable of taking on at least one of value of the distinct wavelengths of the multiplicity of electromagnetic excitations; successively recording wavelengths and intensity values of the electromagnetic emission signals back-scattered by each of the surface elements in response to the electromagnetic excitations produced by the beam; comparing at least one excitation wavelength and at least one corresponding emission wavelength of the recorded intensity value of the electromagnetic signal back-scattered by each of the surface elements with the determined characteristic intensity value of the back-scattered electromagnetic signal of the chemical species that could be contained in the surface portion; and determining the presence of the chemical species in each of the surface elements when the recorded intensity value of the electromagnetic signal back-scattered by the surface element is greater than a threshold defined at least by the determined characteristic intensity value of the back-scattered electromagnetic signal of the chemical species.