The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2005
Filed:
Mar. 05, 2003
John W. Juvinall, Ottawa Lake, MI (US);
Brian A. Langenderfer, Sylvania, OH (US);
James A. Ringlien, Maumee, OH (US);
Timothy J. Nicks, Maumee, OH (US);
William H. Anderson, Sylvania, OH (US);
John W. Juvinall, Ottawa Lake, MI (US);
Brian A. Langenderfer, Sylvania, OH (US);
James A. Ringlien, Maumee, OH (US);
Timothy J. Nicks, Maumee, OH (US);
William H. Anderson, Sylvania, OH (US);
Owens-Brockway Glass Container Inc., Toledo, OH (US);
Abstract
Apparatus for inspecting a container finish includes at least one light source for directing light energy onto the sealing surface of a container. At least one light sensor is disposed to receive light energy reflected from the sealing surface of the container, and is responsive to such reflected light energy to provide signals indicative of the level of the sealing surface at at least four points on the sealing surface spaced from each other around the axis of the container finish. An information processor is responsive to such signals for detecting variations in level at the sealing surface of the container. In the preferred embodiments of the invention, the points on the sealing surface from which reflected energy is received at the sensor are at a nominal angle of 90° from each other. The information processor preferably is responsive to such signals for detecting warp, dip, off-level and overall height variations at the sealing surface.